# A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction

> Research article (IEEE Transactions on Circuits & Systems II Express Briefs, 2020) · cited 19× · AI/ML

**Wikidata**: [openalex:W3037906668](https://www.wikidata.org/wiki/openalex:W3037906668)  
**Source**: https://4ort.xyz/entity/a-new-logic-topology-based-scan-chain-stitching-for-test-power-reduction