# A New Kind of Atomic Force Microscopy Scan Control Enabled by Artificial Intelligence: Concept for Achieving Tip and Sample Safety Through Asymmetric Control

> Research article (Nanomanufacturing and Metrology, 2024) · cited 11× · AI/ML

**Wikidata**: [openalex:W4394854868](https://www.wikidata.org/wiki/openalex:W4394854868)  
**Source**: https://4ort.xyz/entity/a-new-kind-of-atomic-force-microscopy-scan-control-enabled-by-artificial-intelligence-concept-for-achieving-tip-and-samp