# A New IC Solder Joint Inspection Method for an Automatic Optical Inspection System Based on an Improved Visual Background Extraction Algorithm

> Research article (IEEE Transactions on Components Packaging and Manufacturing Technology, 2015) · cited 68× · AI/ML

**Wikidata**: [openalex:W2241204461](https://www.wikidata.org/wiki/openalex:W2241204461)  
**Source**: https://4ort.xyz/entity/a-new-ic-solder-joint-inspection-method-for-an-automatic-optical-inspection-system-based-on-an-improved-visual-backgroun