# A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the Number of Test Patterns Using Partial MaxSAT

> Research article (2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020) · cited 15× · AI/ML

**Wikidata**: [openalex:W3103876292](https://www.wikidata.org/wiki/openalex:W3103876292)  
**Source**: https://4ort.xyz/entity/a-multiple-target-test-generation-method-for-gate-exhaustive-faults-to-reduce-the-number-of-test-patterns-using-partial-