# A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 31× · AI/ML

**Wikidata**: [openalex:W4312875392](https://www.wikidata.org/wiki/openalex:W4312875392)  
**Source**: https://4ort.xyz/entity/a-mfl-mechanism-based-self-supervised-method-for-defect-detection-with-limited-labeled-samples