# A Methodology for Advanced Manufacturing Defect Detection through Self-Supervised Learning on X-ray Images

> Research article (Applied Sciences, 2024) · cited 13× · AI/ML

**Wikidata**: [openalex:W4393201118](https://www.wikidata.org/wiki/openalex:W4393201118)  
**Source**: https://4ort.xyz/entity/a-methodology-for-advanced-manufacturing-defect-detection-through-self-supervised-learning-on-x-ray-images