# A method for characterizing defects in multi-layer conductive structures by combining pulsed eddy current signals with PCA components

> Research article (AIP conference proceedings, 2019) · cited 12× · AI/ML

**Wikidata**: [openalex:W2944347295](https://www.wikidata.org/wiki/openalex:W2944347295)  
**Source**: https://4ort.xyz/entity/a-method-for-characterizing-defects-in-multi-layer-conductive-structures-by-combining-pulsed-eddy-current-signals-with-p