# A Machine-Learning-Resistant 3D PUF with 8-layer Stacking Vertical RRAM and 0.014% Bit Error Rate Using In-Cell Stabilization Scheme for IoT Security Applications

> Research article (2020 IEEE International Electron Devices Meeting (IEDM), 2020) · cited 15× · AI/ML

**Wikidata**: [openalex:W3136937515](https://www.wikidata.org/wiki/openalex:W3136937515)  
**Source**: https://4ort.xyz/entity/a-machine-learning-resistant-3d-puf-with-8-layer-stacking-vertical-rram-and-0-014-bit-error-rate-using-in-cell-stabiliza