# A Light-Weighted CNN Model for Wafer Structural Defect Detection

> Research article (IEEE Access, 2020) · cited 81× · AI/ML

**Wikidata**: [openalex:W3004330853](https://www.wikidata.org/wiki/openalex:W3004330853)  
**Source**: https://4ort.xyz/entity/a-light-weighted-cnn-model-for-wafer-structural-defect-detection