# A Hybrid Deep Learning-Based Framework for Chip Packaging Fault Diagnostics in X-Ray Images

> Research article (IEEE Transactions on Industrial Informatics, 2024) · cited 15× · AI/ML

**Wikidata**: [openalex:W4399039820](https://www.wikidata.org/wiki/openalex:W4399039820)  
**Source**: https://4ort.xyz/entity/a-hybrid-deep-learning-based-framework-for-chip-packaging-fault-diagnostics-in-x-ray-images
