# A Genetic Algorithm-Based Heuristic Method for Test Set Generation in Reversible Circuits

> Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2017) · cited 40× · AI/ML

**Wikidata**: [openalex:W2607482776](https://www.wikidata.org/wiki/openalex:W2607482776)  
**Source**: https://4ort.xyz/entity/a-genetic-algorithm-based-heuristic-method-for-test-set-generation-in-reversible-circuits