# A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards

> Research article (2017 International Test Conference in Asia (ITC-Asia), 2017) · cited 11× · AI/ML

**Wikidata**: [openalex:W2767798807](https://www.wikidata.org/wiki/openalex:W2767798807)  
**Source**: https://4ort.xyz/entity/a-fully-automatic-test-system-for-characterizing-large-array-fine-pitch-micro-bump-probe-cards