# A Framework for Reliability Analysis of Combinational Circuits Using Approximate Bayesian Inference

> Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023) · cited 11× · AI/ML

**Wikidata**: [openalex:W4319998077](https://www.wikidata.org/wiki/openalex:W4319998077)  
**Source**: https://4ort.xyz/entity/a-framework-for-reliability-analysis-of-combinational-circuits-using-approximate-bayesian-inference
