# A framework for detecting unknown defect patterns on wafer bin maps using active learning

> Research article (Expert Systems with Applications, 2024) · cited 22× · AI/ML

**Wikidata**: [openalex:W4402494730](https://www.wikidata.org/wiki/openalex:W4402494730)  
**Source**: https://4ort.xyz/entity/a-framework-for-detecting-unknown-defect-patterns-on-wafer-bin-maps-using-active-learning