# A depthwise convolutional neural network model based on active contour for multi-defect wafer map pattern classification

> Research article (Engineering Applications of Artificial Intelligence, 2024) · cited 12× · AI/ML

**Wikidata**: [openalex:W4404659686](https://www.wikidata.org/wiki/openalex:W4404659686)  
**Source**: https://4ort.xyz/entity/a-depthwise-convolutional-neural-network-model-based-on-active-contour-for-multi-defect-wafer-map-pattern-classification