# A deep learning process anomaly detection approach with representative latent features for low discriminative and insufficient abnormal data

> Research article (Computers & Industrial Engineering, 2022) · cited 37× · AI/ML

**Wikidata**: [openalex:W4312208405](https://www.wikidata.org/wiki/openalex:W4312208405)  
**Source**: https://4ort.xyz/entity/a-deep-learning-process-anomaly-detection-approach-with-representative-latent-features-for-low-discriminative-and-insuff