# A deep learning-based surface defect inspection system using multi-scale and channel-compressed features

> Research article (IEEE Transactions on Instrumentation and Measurement, 2020) · cited 179× · AI/ML

**Wikidata**: [openalex:W3015382364](https://www.wikidata.org/wiki/openalex:W3015382364)  
**Source**: https://4ort.xyz/entity/a-deep-learning-based-surface-defect-inspection-system-using-multi-scale-and-channel-compressed-features