# A Deep Learning-based Approach to Anomaly Detection with 2-Dimensional Data in Manufacturing

> Research article (2019 IEEE 17th International Conference on Industrial Informatics (INDIN), 2019) · cited 18× · AI/ML

**Wikidata**: [openalex:W3004126016](https://www.wikidata.org/wiki/openalex:W3004126016)  
**Source**: https://4ort.xyz/entity/a-deep-learning-based-approach-to-anomaly-detection-with-2-dimensional-data-in-manufacturing