# A Deep convolutional neural network with residual blocks for wafer map defect pattern recognition

> Research article (Quality and Reliability Engineering International, 2021) · cited 24× · AI/ML

**Wikidata**: [openalex:W3193550730](https://www.wikidata.org/wiki/openalex:W3193550730)  
**Source**: https://4ort.xyz/entity/a-deep-convolutional-neural-network-with-residual-blocks-for-wafer-map-defect-pattern-recognition