# A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

> Research article (IEEE Transactions on Semiconductor Manufacturing, 2020) · cited 189× · AI/ML

**Wikidata**: [openalex:W3024903722](https://www.wikidata.org/wiki/openalex:W3024903722)  
**Source**: https://4ort.xyz/entity/a-deep-convolutional-neural-network-for-wafer-defect-identification-on-an-imbalanced-dataset-in-semiconductor-manufactur