# A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing

> Research article (Applied Sciences, 2021) · cited 48× · AI/ML

**Wikidata**: [openalex:W3210425092](https://www.wikidata.org/wiki/openalex:W3210425092)  
**Source**: https://4ort.xyz/entity/a-deep-convolutional-neural-network-based-multi-class-image-classification-for-automatic-wafer-map-failure-recognition-i