# A data-driven method for enhancing the image-based automatic inspection of IC wire bonding defects

> Research article (International Journal of Production Research, 2020) · cited 58× · AI/ML

**Wikidata**: [openalex:W3089801272](https://www.wikidata.org/wiki/openalex:W3089801272)  
**Source**: https://4ort.xyz/entity/a-data-driven-method-for-enhancing-the-image-based-automatic-inspection-of-ic-wire-bonding-defects