# A Cryogenic On-Chip Noise Measurement Procedure With ±1.4-K Measurement Uncertainty

> Research article (2022 IEEE/MTT-S International Microwave Symposium - IMS 2022, 2022) · cited 10× · AI/ML

**Wikidata**: [openalex:W4293868501](https://www.wikidata.org/wiki/openalex:W4293868501)  
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