# A Comprehensive Gate and Drain Trapping/Detrapping Noise Model and its Implications for Thin-Dielectric MOSFETs

> Research article (IEEE Transactions on Electron Devices, 2021) · cited 15× · AI/ML

**Wikidata**: [openalex:W3194971064](https://www.wikidata.org/wiki/openalex:W3194971064)  
**Source**: https://4ort.xyz/entity/a-comprehensive-gate-and-drain-trapping-detrapping-noise-model-and-its-implications-for-thin-dielectric-mosfets