# A Complete Statistical Investigation of RTN in HfO<sub>2</sub>-Based RRAM in High Resistive State

> Research article (IEEE Transactions on Electron Devices, 2015) · cited 115× · AI/ML

**Wikidata**: [openalex:W1571862906](https://www.wikidata.org/wiki/openalex:W1571862906)  
**Source**: https://4ort.xyz/entity/a-complete-statistical-investigation-of-rtn-in-hfo-lt-sub-gt-2-lt-sub-gt-based-rram-in-high-resistive-state