# A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection

> Research article (2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022) · cited 12× · AI/ML

**Wikidata**: [openalex:W4311224533](https://www.wikidata.org/wiki/openalex:W4311224533)  
**Source**: https://4ort.xyz/entity/a-comparative-study-of-deep-learning-object-detectors-for-semiconductor-defect-detection