# A class imbalanced wafer defect classification framework based on variational autoencoder generative adversarial network

> Research article (Measurement Science and Technology, 2022) · cited 16× · AI/ML

**Wikidata**: [openalex:W4308024561](https://www.wikidata.org/wiki/openalex:W4308024561)  
**Source**: https://4ort.xyz/entity/a-class-imbalanced-wafer-defect-classification-framework-based-on-variational-autoencoder-generative-adversarial-network