# A CAM-Based Weakly Supervised Method for Surface Defect Inspection

> Research article (IEEE Transactions on Instrumentation and Measurement, 2022) · cited 20× · AI/ML

**Wikidata**: [openalex:W4226320329](https://www.wikidata.org/wiki/openalex:W4226320329)  
**Source**: https://4ort.xyz/entity/a-cam-based-weakly-supervised-method-for-surface-defect-inspection