# A Bayesian Approach for Predicting Functional Reliability of One-Shot Devices

> Research article (International journal of industrial engineering, 2019) · cited 10× · AI/ML

**Wikidata**: [openalex:W2924975473](https://www.wikidata.org/wiki/openalex:W2924975473)  
**Source**: https://4ort.xyz/entity/a-bayesian-approach-for-predicting-functional-reliability-of-one-shot-devices